Show simple item record

dc.contributor.authorSadik, O. A.
dc.contributor.authorDu, N.
dc.contributor.authorKariuki, V.
dc.contributor.authorOkello, V.
dc.contributor.authorBushlyar, V.
dc.date.accessioned2018-11-15T09:13:13Z
dc.date.available2018-11-15T09:13:13Z
dc.date.issued2014-05-20
dc.identifier.citationACS Sustainable Chem. Eng. 2014, 2, 7, 1707-1716en_US
dc.identifier.urihttps://pubs.acs.org/doi/10.1021/sc500175v
dc.identifier.urihttp://ir.mksu.ac.ke/handle/123456780/1564
dc.description.abstractThis paper provides a survey of conventional and emerging techniques that are available for characterizing engineered nanoparticles in complex matrices. Techniques that were considered include microscopy (TEM, SEM, HRTEM, DLS, SNOM), chromatography (HDC, FFF), mass spectroscopy (ICP-MS, SEC-ICP/MS, MALDI, FFF-ICP-MS), sp-ICP-MS, and electrochemical techniques. A case study is presented from the authors’ laboratories for the design of a portable nanoparticle analyzer based on tangential flow filtration and electrochemical detection (EC-TFF). EC-TFF is equipped with poly(amic) acid membrane filter electrodes (PMFE) arrays that perform multiple functions to capture, isolate, and detect (CID) engineered nanoparticles. The application of EC-TFF is presented for the characterization of engineered nanosilver in real-world samples. A sizedependent isolation of AgNPs was achieved at varying particle sizes with over 98.5% removal efficiency. PEC-TFF AA showed an excellent performance not only for isolation at subnanometersized ranges but also as a platform for detection of engineered nanoparticles at low ppb levels.en_US
dc.language.isoen_USen_US
dc.publisherAmerican Chemical Societyen_US
dc.subjectElectrochemistryen_US
dc.subjectNanotoolsen_US
dc.titleCurrent and Emerging Technologies for the Characterization of Nanomaterialsen_US
dc.typeArticleen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record