Current and Emerging Technologies for the Characterization of Nanomaterials
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Date
2014-05-20Author
Sadik, O. A.
Du, N.
Kariuki, V.
Okello, V.
Bushlyar, V.
Metadata
Show full item recordAbstract
This paper provides a survey of conventional and emerging techniques that are available for
characterizing engineered nanoparticles in complex matrices. Techniques that were considered
include microscopy (TEM, SEM, HRTEM, DLS, SNOM), chromatography (HDC, FFF), mass
spectroscopy (ICP-MS, SEC-ICP/MS, MALDI, FFF-ICP-MS), sp-ICP-MS, and electrochemical
techniques. A case study is presented from the authors’ laboratories for the design of a portable
nanoparticle analyzer based on tangential flow filtration and electrochemical detection (EC-TFF).
EC-TFF is equipped with poly(amic) acid membrane filter electrodes (PMFE) arrays that perform
multiple functions to capture, isolate, and detect (CID) engineered nanoparticles. The application of
EC-TFF is presented for the characterization of engineered nanosilver in real-world samples. A sizedependent
isolation of AgNPs was achieved at varying particle sizes with over 98.5% removal
efficiency. PEC-TFF AA showed an excellent performance not only for isolation at subnanometersized
ranges but also as a platform for detection of engineered nanoparticles at low ppb levels.